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MAPAN-Journal of Metrology Society of India

MAPAN-Journal of Metrology Society of India
简称:MAPAN-J METROL SOC I
ISSN:0970-3950
EISSN:0970-3950
研究方向:工程技术-物理:应用
自引率:7.70%
五年影响因子:1.1
JCI期刊引文指标 :0.25
h-index:13
Gold OA文章占比:3.82%

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MAPAN-Journal of Metrology Society of India英文简介

MAPAN-Journal Metrology Society of India is a quarterly publication. It is exclusively devoted to Metrology (Scientific, Industrial or Legal). It has been fulfilling an important need of Metrologists and particularly of quality practitioners by publishing exclusive articles on scientific, industrial and legal metrology.

The journal publishes research communication or technical articles of current interest in measurement science; original work, tutorial or survey papers in any metrology related area; reviews and analytical studies in metrology; case studies on reliability, uncertainty in measurements; and reports and results of intercomparison and proficiency testing.

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